Non-contact sensing apparatus and method for temperature profile

Details Non-contact sensing apparatus and method for temperature profile Non-contact sensing apparatus and method for temperature profile

1989-04-26

1991-02-05

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

356 43, 356382, 374126, G01N 2101, G01J 528, G01J 506, G01B 1106

Patent

active

049899708

ABSTRACT:
A device and method are provided for determining the bulk (average) temperature, surface temperature, temperature profile, and thickness of radiation translucent materials. These material functions are determined by evaluation of the intensity of the radiation emitted from the material using two detectors with a radiation source placed in the optical path of one of the detectors. The data is taken at several intensities of source radiation and reduced to obtain the bulk temperature and material thickness. The second detector is used to measure the surface temperature. These data are then used to determine the temperature profile in the material.

REFERENCES:
patent: 4502793 (1988-05-01), Smith et al.
patent: 4522510 (1985-09-01), Rosencwaig et al.

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