Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-07-28
1998-11-03
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 25055929, G01B 1114
Patent
active
058317350
ABSTRACT:
An Optical Probe Measurement Device accurately and efficiently measures locations of visible features of a structure without making contact with the structure. It employs a centering microscope which a user looks through to locate the feature to be measured. The centering microscope is connected to an orientation plate in a known pose which has targets measurable with a 3D measurement device. The 3D measurement device determines 3D locations of the targets. A light source is attached to the orientation plate to produce a light beam which intersects the optical axis at the focal point of the centering microscope, being a distance D.sub.0 away from the end of the centering microscope. When this light beam impinges on the surface of the structure at the same location as the feature seen in the centering microscope, the feature is exactly the D.sub.0 away from the centering microscope. A calculation device receives the measured 3D locations of the targets, the pose of the centering microscope relative to the orientation plate, and the distance D.sub.0, and calculates the actual 3D location of the focal point, also being the location of the feature on the structure. Optionally a triggering device may be used to indicate when to calculate the location of the focal point.
REFERENCES:
patent: 5216235 (1993-06-01), Lin
patent: 5379106 (1995-01-01), Baldur
patent: 5499097 (1996-03-01), Ortyn et al.
Font Frank G.
General Electric Company
Smith Zandra V.
Snyder Marvin
Zale Lawrence P.
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