Non-contact non-destructive latent image scanner

Details Non-contact non-destructive latent image scanner Non-contact non-destructive latent image scanner

1992-03-02

1994-05-17

Coles, Sr., Edward L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356355, 356372, 356376, G01B 902

Patent

active

053132653

ABSTRACT:
A latent image scanner 10 comprising a three-color laser-diode interferometer 11 having either thickness gauge optical geometry 12 or profiler optical geometry 12a is focused on a spot on a surface of a reference optic 14 having a latent image residue thereon. The interferometry thickness gauge 10 or profiler 10a measures and records the height and location of the spot. The scanner 10 is then focused on a new spot by moving an associated X-Y mechanical translator 13. A complete scan of the surface of the reference optic 14 results in a three dimensional data array correlating height profile to X-Y coordinates of the surface of the reference optic 14. The difference between the absolute height profile and the known height of the reference optic 14 represents the latent image.

REFERENCES:
patent: 4191940 (1980-03-01), Polcyn et al.
patent: 4657394 (1987-04-01), Halioua
patent: 4817183 (1989-03-01), Sparrow

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