Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1998-03-13
2000-06-13
Gutierrez, Diego
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374121, 374124, 374127, G01J 506, G01J 510, G01K 306
Patent
active
060740876
ABSTRACT:
The subject invention relates to a technique employing a calibrated thermal radiometer, and the radiation characteristics of ionic crystals to measure the temperature distribution of crystals during crystal growth. When in high temperature, the ionic crystals often exhibit a transparent region having low reflectance, and low absorption in the spectrum between the short-wavelength absorption edge and the long-wavelength absorption edge. In addition, these crystals have an opaque spectral region having low reflectance and high absorption, i.e. have surface radiation of high emissivity when the spectrum is in the range between the long-wavelength absorption edge and the onset of the Reststrahlen band. The spectral emissivity of the ionic crystal may not change significantly with a variation of temperature in this opaque region. According to Planck's law, the surface temperature distribution during crystal growth can be obtained after the surface radiation of the opaque region is detected, and the emissivity at the melting point is calculated.
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Chen Jyh-Chen
Hu Chieh
Lee Yeou-Chang
Gutierrez Diego
National Security Council
Pruchnic Jr. Stanley J.
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