Non-contact measurement system and method

Image analysis – Applications – 3-d or stereo imaging analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S153000

Reexamination Certificate

active

10249279

ABSTRACT:
A system and method for non-contact measurement of a complex part is provided. The method comprises acquiring an image of the complex part including imposed laser lines on the complex part using at least one imaging device, determining a span of interest of the complex part being representative of at least a portion of the complex part and which comprises information related to a plurality of dimensions of a surface of the complex part, extracting information corresponding to the laser lines from the span of interest to reduce computation and further extracting a plurality of unique points from the information corresponding to the laser lines, the plurality of unique points representing the plurality of dimensions of the surface. The plurality of unique points is used for reconstructing a three-dimensional (3D) representation of the surface of the complex part.

REFERENCES:
patent: 4525858 (1985-06-01), Cline et al.
patent: 4593967 (1986-06-01), Haugen
patent: 4819197 (1989-04-01), Blais
patent: 5396331 (1995-03-01), Kitoh et al.
patent: 5565870 (1996-10-01), Fukuhara et al.
patent: 5661667 (1997-08-01), Rueb et al.
patent: 5781658 (1998-07-01), O'Gorman
patent: 6259519 (2001-07-01), Hooker et al.
patent: 6496262 (2002-12-01), Meng et al.
patent: 6512993 (2003-01-01), Kacyra et al.
patent: 6539106 (2003-03-01), Gallarda et al.
patent: 6539330 (2003-03-01), Wakashiro
patent: 6556307 (2003-04-01), Norita et al.
patent: 6965843 (2005-11-01), Raab et al.
patent: 6987531 (2006-01-01), Kamon
patent: 7046377 (2006-05-01), Leikas
Shortis, MR., Clarke, T.A., Short, T. 1994, A Comparison of Some Techniques for the Subpixel Location of Discrete Target Images, Videometrics III, SPIE vol. 2350, Boston, pp. 239-250.
Carson Steger, 1998, Evaluation of the Sub-Pixel Line and Edge Detection Precision and Accuracy, International Archieves of Photgrammetry and Remote Sensing, vol. XXXII, Part 3/1, 256-264.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-contact measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-contact measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-contact measurement system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3841483

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.