Non-contact electrical connections test device

Details Non-contact electrical connections test device Non-contact electrical connections test device

2007-02-16

2008-11-04

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120, C324S754120

Reexamination Certificate

active

07446543

ABSTRACT:
A non-contact testing of electrical characteristics of substrates carrying dense electrical connections is non-contact in that an injection or an extraction of electrons in the conductors to be tested, is obtained by an electron tearing effect under the effect of an electromagnetic beam of ultraviolet rays. The test device has an electron collector plate conformed as an array of individually addressable electrodes, able to be taken to a positive or negative potential in order to carry out an injection or an extraction of electrons. A capacitor is associated with each electrode. The individual electrode is produced in the form of an open-work conductive grid constituting a first plate of the capacitor. The other plate is constituted by an open-work grid situated plumb with the first one.

REFERENCES:
patent: 4292519 (1981-09-01), Feuerbaum
patent: 4355232 (1982-10-01), Todokoro et al.
patent: 5030908 (1991-07-01), Miyoshi et al.
patent: 6859052 (2005-02-01), Vaucher
patent: 0617294 (1994-09-01), None
patent: 0138892 (2001-05-01), None

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