Non-contact deviation measurement system

Details Non-contact deviation measurement system Non-contact deviation measurement system

2011-07-19

2011-07-19

Nghiem, Michael (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S158000, C702S172000

Reexamination Certificate

active

07983873

ABSTRACT:
A non-contacting deviation measurement system projects a first line and a second line upon a surface of an object. The projections of the first line and second line are arranged to overlap at an intersection line oriented at a nominal location such that when the surface is oriented at the nominal location, the intersection line appears on the surface. As the location of the surface deviates from the nominal location, the first line and second line as projected upon the surface move away from one another. The distance between the lines may be used to calculate the deviation from the nominal location. The deviation calculated may be compared to a predetermined maximum allowable deviation.

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