Non-contact apparatus and method for measuring surface profile

Details Non-contact apparatus and method for measuring surface profile Non-contact apparatus and method for measuring surface profile

2006-06-13

2006-06-13

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Shape or surface configuration

Triangulation

Reexamination Certificate

active

07061628

ABSTRACT:
Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.

REFERENCES:
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“Full˜field Surface Profiling Using Dynamic Projected Grids”, Robert J. Beeson, Southwest Research Institute, San Antonio, Texas SPIE vol. 3204, pp. 68-73.

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