Non-ambipolar radio-frequency plasma electron source and...

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation

Reexamination Certificate

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C250S382000, C250S385100, C250S387000, C315S111310, C315S111210, C313S231310, C313S363100

Reexamination Certificate

active

07875867

ABSTRACT:
An electron generating device extracts electrons, through an electron sheath, from plasma produced using RF fields. The electron sheath is located near a grounded ring at one end of a negatively biased conducting surface, which is normally a cylinder. Extracted electrons pass through the grounded ring in the presence of a steady state axial magnetic field. Sufficiently large magnetic fields and/or RF power into the plasma allow for helicon plasma generation. The ion loss area is sufficiently large compared to the electron loss area to allow for total non-ambipolar extraction of all electrons leaving the plasma. Voids in the negatively-biased conducting surface allow the time-varying magnetic fields provided by the antenna to inductively couple to the plasma within the conducting surface. The conducting surface acts as a Faraday shield, which reduces any time-varying electric fields from entering the conductive surface, i.e. blocks capacitive coupling between the antenna and the plasma.

REFERENCES:
patent: 2826708 (1958-03-01), Foster, Jr.
patent: 4517495 (1985-05-01), Piepmeier
patent: 4549082 (1985-10-01), McMillan
patent: 4910436 (1990-03-01), Collins et al.
patent: 4977352 (1990-12-01), Williamson
patent: 5081398 (1992-01-01), Asmussen et al.
patent: 5107170 (1992-04-01), Ishikawa et al.
patent: 5198718 (1993-03-01), Davis et al.
patent: 5241244 (1993-08-01), Cirri
patent: 5468955 (1995-11-01), Chen et al.
patent: 5663971 (1997-09-01), Carlsten
patent: 5874807 (1999-02-01), Neger et al.
patent: 6014387 (2000-01-01), Carlsten
patent: 6060718 (2000-05-01), Brailove et al.
patent: 6100536 (2000-08-01), Ito et al.
patent: 6150755 (2000-11-01), Druz et al.
patent: 6184623 (2001-02-01), Sugai et al.
patent: 6211622 (2001-04-01), Ryoji et al.
patent: 6417111 (2002-07-01), Nishikawa et al.
patent: 6512333 (2003-01-01), Chen
patent: 6661165 (2003-12-01), Closs et al.
patent: 6768120 (2004-07-01), Leung et al.
patent: 6805779 (2004-10-01), Chistyakov
patent: 6809310 (2004-10-01), Chen
patent: 6849857 (2005-02-01), Ichiki et al.
patent: 6870321 (2005-03-01), Schartner et al.
patent: 6967334 (2005-11-01), Suzuki et al.
patent: 7012263 (2006-03-01), Murata et al.
patent: 7064491 (2006-06-01), Horsky et al.
patent: 7078862 (2006-07-01), Fukuda et al.
patent: 7087912 (2006-08-01), Hamamoto
patent: 7326937 (2008-02-01), Mehta et al.
patent: 7498592 (2009-03-01), Hershkowitz et al.
patent: 2001/0015173 (2001-08-01), Matsumoto et al.
patent: 2003/0209430 (2003-11-01), Hamamoto
patent: 2004/0036032 (2004-02-01), Leung et al.
patent: 2004/0221815 (2004-11-01), Fukuda et al.
patent: 2005/0194361 (2005-09-01), Yeom et al.
patent: 2007/0018562 (2007-01-01), Adamec et al.
patent: 2008/0067430 (2008-03-01), Hershkowitz et al.
patent: 2010/0032587 (2010-02-01), Hosch et al.
Veeco, Product Specification: RFN-300 (RF Neutralizer) External Specification—Manual #425430 Rev. A.
Veeco Product RFN-300 Product Manual (excerpts) 2005.
“Helicons—The Early Years,” Rod W. Boswell and Francis F. Chen, IEEE Transactions on Plasma Science, vol. 25, No. 6, pp. 1229-1244, Dec. 1997.
“Helicons—The Past Decade,” Francis F. Chen and Rod W. Boswell, IEEE Transactions on Plasma Science, vol. 25, No. 6, pp. 1244-1257, Dec. 1997.
“Sheaths: More complicated than you think,” Noah Hershkowitz, Physics of Plasma 12, 052502, pp. 1-11 (2005), American Institute of Physics.
“Steady-state ion pumping of a potential dip near an electron collecting anode,” Cary Forest and Noah Hershkowitz, J. Appl. Phys. 60(4), pp. 1295-1299, Aug. 15, 1986, American Institute of Physics.
“Neutral pumping in a helicon discharge,” J. Gilland, R. Breun, and N. Hershkowitz, Plasma Sources Sci. Technol. 7, pp. 416-422, (1998).
High Density Plasma Sources, Design, Physics and Performance, Preface and Chapters 1-3 and 7, Oleg A. Popov (Ed.) (1995).
“Non-Ambipolar Electron Extraction from a Weakly Magnetized RF Plasma,” Noah Hershkowitz and Ben W. Longmier, Powerpoint presentation, IEEE International Conference on Plasma Science, University Wisconsin—Madison, Jun. 4-8, 2006.
“‘Electrodeless’ Plasma Cathode for Neutralization of Ion Thrusters,” Ben Longmier and Noah Hershkowitz, Powerpoint Presentation, 41stAIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit, Tuscon, AZ, Jul. 10-13, 2005.
“‘Electrodeless’ Plasma Cathode for Neutralization of Ion Thrusters,” Ben Longmier and Noah Hershkowitz, 41stAIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit, pp. 1-7, Tuscon, AZ, Jul. 10-13, 2005.
“Nonambipolar Electron Source for Neutralization of Ion and Hall Thrusters,” Ben W. Longmier and Noah Hershkowitz, 29thInternational Electric Propulsion Conference, pp. 1-9, Princeton University, Oct. 31-Nov. 4, 2005.
“Nonambipolar Electron Source for Neutralization of Ion and Hall Thrusters,” Ben W. Longmier and Noah Hershkowitz, Poster presented at the 29thInternational Electric Propulsion Conference, Princeton University, Oct. 31-Nov. 4, 2005.

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