Non-abrasive electrical test contact

Details Non-abrasive electrical test contact Non-abrasive electrical test contact

2007-08-14

2007-08-14

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C439S070000

Reexamination Certificate

active

11460632

ABSTRACT:
A hybrid non-abrasive electrical test contact element of a test socket is taught. Unlike cantilever contact elements of the prior art, the contact element of the present invention is able to contact a lead of an integrated circuit device under test without abrading the plating on the lead. This is achieved by the contact element possessing multiple loops to allow the tip of the contact element to move not only downwards, but also sideways in a rocking and non-sliding motion. The tip of the contact is also shaped to contact the lead at only a radius corner of each lead so as not to affect the solderability of the lead. In addition, tests have shown that the contact element of the present invention has at least twice the working life span compared to another contact element of the prior art.

REFERENCES:
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patent: 4997378 (1991-03-01), Matsuoka et al.
patent: 5308256 (1994-05-01), Tonooka
patent: 5952843 (1999-09-01), Vinh
patent: 5998228 (1999-12-01), Eldridge et al.
patent: 6396294 (2002-05-01), An et al.
patent: 6830461 (2004-12-01), Sakamoto et al.

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