Noise suppression in large three state busses during test

Details Noise suppression in large three state busses during test Noise suppression in large three state busses during test

1994-01-12

1996-08-27

Voeltz, Emanuel T.

Excavating

364574, 371 27, 371 28, H04B 1500

Patent

active

055508405

ABSTRACT:
A method for suppressing noise encountered during testing of large semiconductor chips is disclosed herein. Output drivers on the semiconductor chip may occasionally produce errant signals during testing, and such errant signals may be coupled through ground or nearby pins which are asynchronous edge sensitive pins to produce false internal transitions. The false internal transitions can cause the chip to fail the test. The proposed method suppresses the noise by disabling the output drivers during portions of the test which may induce errant signals and enables the output drivers when such potentially errant signals have passed.

REFERENCES:
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patent: 5119321 (1992-06-01), Burton, Jr. et al.
patent: 5149990 (1992-09-01), Yamazaki et al.
patent: 5265038 (1993-11-01), Kwok
patent: 5311453 (1994-05-01), Denenberg et al.
patent: 5386393 (1995-01-01), Hallee et al.

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