Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-02-04
1999-06-29
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, 385 12, G01B 902
Patent
active
059175974
ABSTRACT:
Leakage optical signals injected into a time division multiplexed sensor system are modulated during off periods in the duty cycle in the sensor interrogation signal. The leakage light is modulated such that its unwanted contributions to the sensor output signals are displaced in frequency from the base band frequency. This frequency displacement greatly reduces unwanted noise power in the received signals.
Bunn, Jr. James S.
Hall David B.
Kim Robert H.
Lee Andrew H.
Litton Systems Inc.
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