Noise shaping time to digital converter

Oscillators – Automatic frequency stabilization using a phase or frequency... – Afc with logic elements

Reexamination Certificate

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C327S001000

Reexamination Certificate

active

07741917

ABSTRACT:
According to an embodiment of a time to digital converter, the time difference between a signal of interest and a reference signal is measured by operating a digitally controlled oscillator at a first frequency during a first portion of the reference signal period and changing the operating frequency from the first frequency to a second frequency during the reference signal period as a function of the time difference between the signal of interest and the reference signal. The time to digital converter continuously counts how many signal transitions occur at an output of the digitally controlled oscillator during the reference signal period. The time difference between the signal of interest and the reference signal is estimated based on the number of signal transitions counted during the reference signal period.

REFERENCES:
patent: 6754613 (2004-06-01), Tabatabaei et al.
patent: 6809676 (2004-10-01), Younis et al.
patent: 2005/0162204 (2005-07-01), Lee et al.
patent: 2008/0069292 (2008-03-01), Straayer et al.
patent: 01/69328 (2001-09-01), None
Fan, Y. “Time-to-Digital Converter for RF Frequency Syntheszer.” Helsinki University of Technology, S-87.4198 Postgraduate Course in Electronic Circuit Design II, May 16, 2006. Available at http://www.ecdl.tkk.fi/education/4198/pdf/img-VND641200.pdf, p. 1-19.
Dudek, P. et al. “A High-Resolution CMOS Time-to-Digital Converter Utilizing a Vernier Delay Line.” IEEE Transactions on Solid-State Circuits, vol. 35, No. 2, February 2000, pp. 240-247.

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