Noise reduction during testing of integrated circuit chips

Details Noise reduction during testing of integrated circuit chips Noise reduction during testing of integrated circuit chips

1985-09-03

1987-02-17

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, G01R 1512, G01R 3128

Patent

active

046442650

ABSTRACT:
Disclosed is a test system having circuitry for reducing off-chip driver switching (delta I) noise. The test system employs a tester connected to and electrically testing an integrated circuit chip. The integrated circuit chip has a plurality of input terminals for receiving an electrical test pattern from the tester. The integrated circuit chip also includes a plurality of output driver circuits having outputs connected to the tester. The test system is characterized in that the integrated circuit chip includes a driver sequencing network under control of the tester for sequentially conditioning the off-chip driver circuits for possible switching.

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