Noise parameter test method and apparatus

Details Noise parameter test method and apparatus Noise parameter test method and apparatus

1988-10-25

1991-03-05

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324612, G01R 2728

Patent

active

049980718

ABSTRACT:
Method and apparatus for simultaneously measuring noise power of a two-port device under test (DUT) using a one-port tuner, a low-noise amplifier, a power divider with a plurality of outputs, and a plurality of noise meters. The noise meters are configured to measure available noise power in different frequency ranges which are closely spaced around a selected central frequency, thereby yielding the noise parameters of the DUT at the central frequency.

REFERENCES:
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patent: 4502028 (1985-02-01), Leake
patent: 4908570 (1990-03-01), Gupta et al.
patent: 4918373 (1990-04-01), Newberg
"IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959", Proc. IRE, vol. 48, pp. 60-68, Jan. 1960.
H. Fukui, "Available Power Gain, Noise Figure, and Noise Measure of Two-Ports and Their Graphical Representations", IEEE Trans. Circuit Theory, vol. CT-13, pp. 137-142, Jun. 1966.
Richard Lane, "The Determination of Device Noise Parameters", Proc. IEEE, vol. 57, pp. 1461-1462, Aug. 1969.
Vahe Adamian and Arthur Uhlir, Jr., "Simplified Noise Evaluation of Microwave Receivers", IEEE Transactions on Instrumentation and Measurement, vol. IM-33, No. 2, Jun. 1984.
Victor Larock and Rene Meys, "Automatic Noise Temperature Measurement Through Frequency Variation", IEEE Transactions on Microwave Theory and Techniques, vol. MTT-30, No. 8, Aug. 1982.

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