Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1990-06-18
1991-11-26
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324612, 333101, G01R 2728
Patent
active
050686151
ABSTRACT:
A one port tuner having a source port for connection to a device under test so that, in combination with a noise meter, the noise performance of such device can be evaluated. Preferably the one port tuner includes a plurality of predetermined admittances, a switching device having an output port for selectively connecting one of the admittances to the output port, and a two port device having a selectable response and interconnected between the output port of the switching device and the source port of the one port tuner. Desirably, the two port device includes a multiple-state attenuator where the signal passing through the attenuator is selectable in degree. Alternatively, or in combination, the two port device includes a phase shifter where the phase of the signals passing through the phase shifter are selectively shiftable. Optionally, the one port tuner includes a variable amplifier, variable phase shifter, and variable bandpass filter in serial connection with each other where the two legs of the serial connection are coupled to the source port by a signal feedthrough device.
REFERENCES:
patent: 3611199 (1971-10-01), Safran
patent: 4502028 (1985-02-01), Leake
"IRE Standards on Methods of Measuring Noise in Linear Two Ports, 1959".
Proc. IRE, vol. 48, pp. 60-68, Jan. 1960, H. Fukui "Available Power Gain, Noise Figure, and Noise Measure of Two-Ports and Their Graphical Representations".
IEEE Trans. Circuit Theory, vol. CT-13, pp. 137-142, Jun. 1966, Richard Lane, "The Determination of Device Noise Parameters".
Proc. IEEE, vol. 57, pp. 1461-1462, Aug. 1969.
Vahe Adamian and Arthur Uhlir, Jr., "Simplified Noise Evaluation of Microwave Receivers".
IEEE Transactions on Instrumentation and Measurement, vol. IM-33, No. 2, Jun. 1984, Victor Larock and Rene Meys "Automatic Noise Temperature Measurement Through Frequency Variation".
IEEE Transactions on Microwave Theory and Techniques, vol. MTT-30, No. 8, Aug. 1982.
Leake Bernard W.
Strid Eric W.
Cascade Microtech, Inc.
Harvey Jack B.
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