Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1995-06-06
1997-03-04
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324 7671, 455 673, G01R 2726
Patent
active
056083319
ABSTRACT:
A noise measurement test system 10' for making phase noise and amplitude noise measurements of microwave signals derived from a continuous wave RF source. The system 10' comprises an RF input for receiving an applied RF noise signal and an RF coupler 11 coupled to the RF input for splitting the applied RF noise signal into first and second paths 18a, 18b. A mixer 15 that comprises a synchronous phase detector 15 is coupled to receive signals from the first and second paths 18a, 18b, respectively, and which outputs demodulated phase noise. The first path 18a comprises a variable attenuator 14 and a variable phase shifter 13 coupled between the coupler 11 and the first input of the mixer 15 for providing a reference signal input to the synchronous detector 15. The second path 18b comprises a delay line and an adjustable RF carrier nulling circuit 30 coupled between the coupler 11 and the mixer 15. A video amplifier is coupled to an output of the mixer 15 for providing a baseband video output signal from the system 10' that is processed to produce noise data.
REFERENCES:
patent: 4144491 (1979-03-01), Hutcheon
patent: 4918373 (1990-04-01), Newberg
patent: 5263185 (1993-11-01), Bush
Newberg Irwin L.
Rzyski Gene
Stevens Richard A.
Wagner Gene A.
Alkov Leonard A.
Denson-Low Wanda K.
Hughes Electronics
Regan Maura K.
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