Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-10-22
2011-11-08
Nguyen, Vincent Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S678000
Reexamination Certificate
active
08054090
ABSTRACT:
In a capacitive sensor of the type having X electrodes which are driven and Y electrodes that are used as sense channels connected to charge measurement capacitors, signal measurements are made conventionally by driving the X electrodes to transfer successive packets of charge to the charge measurement capacitors. However, an additional noise measurement is made by emulating or mimicking the signal measurement, but without driving the X electrodes. The packets of charge transferred to the charge accumulation capacitor are then indicative of noise induced on the XY sensing nodes. These noise measurements can be used to configure post-processing of the signal measurements.
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patent: 2002/0186210 (2002-12-01), Itoh
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“International Application Serial No. PCT/US2009/061543, Search Report mailed Jan. 7, 2010”, 3 pgs.
“International Application Serial No. PCT/US2009/061543, Written Opinion mailed Jan. 7, 2010”, 4 pgs.
Philipp Harald
Pickett Daniel
Yilmaz Esat
Atmel Corporation
Baker & Botts L.L.P.
Nguyen Vincent Q
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