Noise generator for evaluating mixed signal integrated circuits

Details Noise generator for evaluating mixed signal integrated circuits Noise generator for evaluating mixed signal integrated circuits

1996-07-22

1997-09-16

Mis, David

Oscillators

Electrical noise or random wave generator

331 48, 331 57, 331 74, 324613, H03B 524, H03B 2900

Patent

active

056685076

ABSTRACT:
A method and apparatus for generating noise to be used in evaluation and testing of digital or analog integrated circuits. One or more noise generators fabricated on a substrate generate noise representative of the digital switching noise generated by a digital integrated circuit. The noise generator may be programmable to generate noise over a wide frequency and amplitude range. In addition, a plurality of noise generators may be used to independently and simultaneously generate noise signals with multiple frequencies and amplitudes. A test circuit, either analog or digital, is fabricated on the same substrate. The generated noise signal(s) are generated for use in the evaluation and testing of the effects of the noise on the analog or digital test circuit.

REFERENCES:
patent: 5148124 (1992-09-01), Goff
Blalack, Tallis, et al., "The Effects of Switching Noise on an Oversampling A/D Converter," 1995 IEEE International Solid-State Circuits Conference Digest of Technical Papers, Feb. 16, 1995, pp. 200-201.
Su, David K., et al., "Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits," IEEE Journal of Solid-State Circuits, vol. 28, No. 4, Apr. 1993, pp. 420-430.
Young, Ian A., et al., "A PLL Clock Generator with 5 to 110 MHz of Lock Range for Microprocessors," IEEE Journal of Solid-State Circuits, vol. 27, No. 11, Nov. 1992, pp. 1599-1607.

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