Noise burst source for transfer function testing

Details Noise burst source for transfer function testing Noise burst source for transfer function testing

1975-08-27

1977-05-10

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

324 57PS, 324 77G, G01R 2316

Patent

active

040230988

ABSTRACT:
A method and apparatus for accurately measuring the transfer function of a linear system or the linear part of a non-linear system. This is accomplished by using a spectrum estimation technique which utilizes a "transient random" stimulus consisting of a short burst of random signals applied to a system under test for a period of time that is shorter than the time used to measure a single spectrum. Thus the measurement period includes the time for the "transient random" burst and for the response of the system to substantially decya to zero. The spectrum measured over this period is used to form a first estimate of the transfer function. Other "transient random" stimuli, uncorrelated with the prior records, are then generated and the above procedure is repeated to achieve an average value for the transfer function estimate of the desired accuracy. Through the use of several "transient random" stimuli, leakage and distortion in the measurement are minimized, thus greatly improving the accuracy of the estimation technique in measuring the transfer function of the system under test.

REFERENCES:
patent: 2840308 (1958-06-01), Van Horne
patent: 3102231 (1963-08-01), Wolf
patent: 3636443 (1972-01-01), Singh
patent: 3718813 (1973-02-01), Williams, Jr. et al.
E. B. Carey and R. M. Press, COMPARATIVE CIRCUIT TESTER, IBM Technical Disclosure Bulletin, vol. 16, No. 10, Mar. 1974, pp. 3151 and 3152.

Affiliated with

Also associated with

Rating

Noise burst source for transfer function testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Noise burst source for transfer function testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Noise burst source for transfer function testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1985722