Measuring and testing – Gas analysis – With compensation detail
Patent
1997-11-07
1999-10-12
Williams, Hezron
Measuring and testing
Gas analysis
With compensation detail
73 3106, 73 3102, 422 90, 422 98, 29 2501, 324 715, 338 34, G01N 2712, G01N 2900, H01C 700
Patent
active
059658029
ABSTRACT:
An NO.sub.x sensor is produced by sintering a plurality of columnar crystals of .beta.-type Nb.sub.2 O.sub.5. The average value M of aspect ratios b/a (wherein a represents a width and b represents a length) in the columnar crystals is set in a range of 2.11<M.ltoreq.5. The NO.sub.x sensor has a high sensitivity to NO.sub.x via an enhancement attained by control of crystal type and structure.
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Asano Yoichi
Fujisawa Yoshikazu
Nanaumi Masaaki
Ohta Norihiro
Ohta Noriko
Honda Giken Kogyo Kabushiki Kaisha
Wiggins J. David
Williams Hezron
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