Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor
Reexamination Certificate
2011-01-18
2011-01-18
Soward, Ida M (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Physical configuration of semiconductor
C257S496000, C257S613000, C257S615000, C257S798000, C257SE21085, C257SE21214, C257SE21222, C257SE21237, C257SE21239
Reexamination Certificate
active
07872331
ABSTRACT:
A nitride semiconductor wafer is planar-processed by grinding a bottom surface of the wafer, etching the bottom surface by, e.g., KOH for removing a bottom process-induced degradation layer, chamfering by a rubber whetstone bonded with 100 wt %-60 wt % #3000-#600 diamond granules and 0 wt %-40 wt % oxide granules, grinding and polishing a top surface of the wafer, etching the top surface for eliminating a top process-induced degradation layer and maintaining a 0.5 μm-10 μm thick edge process-induced degradation layer.
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Ishibashi Keiji
Matsumoto Naoki
Mikami Hidenori
Drinker Biddle & Reath LLP
Soward Ida M
Sumitomo Electric Industries Ltd.
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