Nitride semiconductor substrate

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S615000, C257SE29089, C257SE21237, C257SE23179

Reexamination Certificate

active

07986030

ABSTRACT:
A nitride semiconductor substrate has a first surface forming a principal surface of the substrate. A first edge is formed by beveling at least a portion of an edge of the first surface of the substrate. A scattering region is formed in at least a portion of the first edge. The scattering region scatters more external incident light than the first surface.

REFERENCES:
patent: 5187118 (1993-02-01), Ohmori et al.
patent: 6998700 (2006-02-01), Toba et al.
patent: 7195545 (2007-03-01), Nakayama et al.
patent: 2004/0129940 (2004-07-01), Iwase et al.
patent: 2004/0195658 (2004-10-01), Nakayama et al.
patent: 2006/0194520 (2006-08-01), Nakayama et al.
patent: 2010/0270649 (2010-10-01), Ishibashi et al.
patent: 2004-319951 (2004-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nitride semiconductor substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nitride semiconductor substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nitride semiconductor substrate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2727096

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.