Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor
Reexamination Certificate
2011-07-26
2011-07-26
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Physical configuration of semiconductor
C257S615000, C257SE29089, C257SE21237, C257SE23179
Reexamination Certificate
active
07986030
ABSTRACT:
A nitride semiconductor substrate has a first surface forming a principal surface of the substrate. A first edge is formed by beveling at least a portion of an edge of the first surface of the substrate. A scattering region is formed in at least a portion of the first edge. The scattering region scatters more external incident light than the first surface.
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Hitachi Cable Ltd.
McGinn IP Law Group PLLC
Patton Paul E
Smith Zandra
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