Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular dopant concentration or concentration profile
Reexamination Certificate
2005-10-06
2011-10-04
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
With particular dopant concentration or concentration profile
C257S103000, C257SE33025, C257SE33030, C257SE21097, C438S047000, C438S094000
Reexamination Certificate
active
08030679
ABSTRACT:
Disclosed is a nitride semiconductor light emitting device including: one or more AllnN layers; an In-doped nitride semiconductor layer formed above the AllN layers; a first electrode contact layer formed above the In-doped nitride semiconductor layer; an active layer formed above the first electrode contact layer; and a p-type nitride semiconductor layer formed above the active layer. According to the nitride semiconductor light emitting device, a crystal defect of the active layer is suppressed, so that the reliability of the nitride semiconductor light emitting device is increased and the light output is enhanced.
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Office Action dated Jun. 27, 2008 in Chinese Application No. 200580035544.0, filed Oct. 6, 2005.
Lee Suk Hun
Son Hyo Kun
Joy Jeremy
LG Innotek Co. Ltd.
Saliwanchik Lloyd & Eisenschenk
Smith Zandra
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