Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular semiconductor material
Reexamination Certificate
2006-10-30
2008-12-09
Dickey, Thomas L. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
With particular semiconductor material
C257S079000, C257S094000, C257S013000, C257SE33033
Reexamination Certificate
active
07462884
ABSTRACT:
A nitride semiconductor device having excellent ESD tolerance, by preventing uneven distribution of the electric current in the p-side nitride semiconductor layer. The p-side nitride semiconductor layer (40) comprises, from the active layer (30) side, (a) a p-side wide band gap layer (12) containing a p-type impurity and (b) a three-layer structure (15) comprising a first p-side nitride semiconductor layer (16), a second p-side nitride semiconductor layer (17), and a third p-side nitride semiconductor layer (18).
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Kasai Hisashi
Miyagi Kazuhiro
Sanga Daisuke
Birch & Stewart Kolasch & Birch, LLP
Dickey Thomas L.
Erdem Fazli
Nichia Corporation
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