Nitride semiconductor and fabrication method thereof

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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Details

C438S022000, C438S093000, C257S079000, C257S103000, C257SE21365, C257SE21366

Reexamination Certificate

active

07368309

ABSTRACT:
The present invention relates to nitride semiconductor, and more particularly, to GaN-based nitride semiconductor and fabrication method thereof. The nitride semiconductor according to the present invention comprises a substrate; a GaN-based buffer layer formed in any one of a group of three-layered structure AlyInxGa1−(x+y)N/InxGa1−xN/GaN where 0≦x≦1 and 0≦y≦1, two-layered structure InxGa1−xN/GaN where 0≦x≦1 and superlattice structure of InxGa1−xN/GaN where 0≦x≦1; and a GaN-based single crystalline layer.

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