Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2007-02-13
2007-02-13
Soward, Ida M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257S011000, C257S014000, C257S015000, C257S020000, C257S024000, C257S051000, C257S066000, C257S067000, C257S069000, C257S070000, C257S075000, C257S094000, C257S096000, C257S097000, C257S101000, C257S102000, C257S103000, C257S184000, C257S189000, C257S615000
Reexamination Certificate
active
10773297
ABSTRACT:
A nitride compound semiconductor element having improved characteristics, productivity and yield. A nitride compound semiconductor element includes: a sapphire substrate; a first single crystalline layer of AlN formed on said sapphire substrate; a second single crystalline layer formed on said first single crystalline layer, said second single crystalline layer being made of AlxGa1-xN (0.8≦x≦0.97) and having a thickness of equal to or more than 0.3 μm and equal to or less than 6 μm; and a device structure section of a nitride semiconductor formed on said second single crystalline layer.
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Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Soward Ida M.
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