Nitride based semiconductor laser device with oxynitride...

Coherent light generators – Particular active media – Semiconductor

Reexamination Certificate

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Reexamination Certificate

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07978744

ABSTRACT:
One facet of a nitride based semiconductor laser device is composed of a cleavage plane of (0001), and the other facet thereof is composed of a cleavage plane of (0001). Thus, the one facet and the other facet are respectively a Ga polar plane and an N polar plane. A portion of the one facet and a portion of the other facet, which are positioned in an optical waveguide, constitute a pair of cavity facets. A first protective film including nitrogen as a constituent element is formed on the one facet. A second protective film including oxygen as a constituent element is formed on the other facet.

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An office action issued to a relevant U.S. Appl. No. 12/130,551 on Apr. 21, 2010.
An office action issued to a relevant U.S. Appl. No. 12/128,400 on Jul. 12, 2010.
An office action issued to a relevant U.S. Appl. No. 12/128,400 on Jul. 12, 2010.
Kuniyoshi Okamoto et al., “Continuous-Wave Operation of m-Plane InGaN Multiple Quantum Well Laser Diodes,” Japanese Journal of Applied Physics, vol. 46, No. 9, 2007, pp. L187-L189.
An office action issued to a relevant U.S. Appl. No. 12/130,551 on Sep. 23, 2010.

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