Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-05-13
2009-12-08
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C073S862541, C073S862550, C702S130000
Reexamination Certificate
active
07629799
ABSTRACT:
A system for measuring nip width for a nip present between two rolls includes: (a) a sensor assembly; (b) a resistance-measuring unit that measures an electrical resistance; (c) first and second leads, the first lead being connected to a first strip of the sensor assembly adjacent a first end of the first strip, the second lead being connected to a second strip of the sensor assembly; and (d) a controller operatively associated with the resistance-measuring unit, the controller including computer readable program code, the code including a plurality of data sets, each of the data sets representing a relationship between resistance of a sensor and environmental temperature.
REFERENCES:
patent: 6370961 (2002-04-01), Trantzas et al.
patent: 6568285 (2003-05-01), Moore et al.
PCT WO 00/049379 Nip width sensing system and method (Entire copy attached).
International Search Report and the Written Opinion of the International Searching Authority for International patent application No. PCT/US2005/016785 mailed on Sep. 1, 2005.
Myers Bigel & Sibley & Sajovec
Nguyen Vincent Q
Stowe Woodward L.L.C.
LandOfFree
NIP width sensing system and method for elevated temperature... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with NIP width sensing system and method for elevated temperature..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and NIP width sensing system and method for elevated temperature... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4141265