Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1982-03-10
1984-09-25
Smith, Alfred E.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
H01J 4930
Patent
active
044737483
ABSTRACT:
A neutral particle analyzer has a stripping cell for converting a neutral beam into a charged particle beam, a momentum analyzer for deflecting paths of respective charged particles of the charged particle beam emerging from the stripping cell in correspondence with momenta thereof, and a semiconductor energy analyzer comprising a plurality of semiconductor detectors which are arranged in the paths of deflected charged particle beams emerging from the momentum analyzer. The semiconductor energy analyzer generates pulse signals having pulse heights corresponding to masses of and kinetic energies of the deflected charged particles of the deflected charged particle beams.
REFERENCES:
patent: 3517191 (1970-06-01), Liebl
patent: 3872287 (1975-03-01), Koeman
patent: 4320295 (1982-03-01), Eloy
Lamport et al., "A Large Area Circular Position Sensitive Si Detector", Nuclear Instruments an Methods 134, No. 1, Apr. 1976, pp. 71-76.
PPPL-1582, Study of the mass and energy resolution of the E"B charge exchange analyzer for TFTR, R. Kaita et al., Sep. 1979.
Kimura Toyoaki
Konagai Chikara
Matoba Tohru
Miura Iwao
Shirayama Shimpey
Berman Jack I.
Japan Atomic Energy Research Institute
Smith Alfred E.
Tokyo Shibaura Denki Kabushiki Kaisha
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