Nephelometer instrument for measuring turbidity of water

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07663751

ABSTRACT:
The specific wavelength of 525 nm is described as a single monochromatic light source used in the determination of turbidity by nephelometry at 90° for particulate matter in raw water, water treatment, waste water treatment and industrial process streams. This wavelength improves the detection of smaller particle concentration in water where light scattering characteristics of shorter wavelengths are superior to light sources using longer wavelengths.

REFERENCES:
patent: 4826319 (1989-05-01), Namba et al.
patent: 5250186 (1993-10-01), Dollinger et al.
patent: 5332905 (1994-07-01), Brooker et al.
patent: 5872361 (1999-02-01), Paoli et al.
patent: 5969814 (1999-10-01), Barber et al.
patent: 6842243 (2005-01-01), Tokhtuev et al.
patent: 7029628 (2006-04-01), Tam et al.
patent: 7242001 (2007-07-01), Hedges et al.
patent: 7491366 (2009-02-01), Tokhtuev et al.
patent: 2007/0127021 (2007-06-01), Dal Sasso et al.
patent: 2008/0137080 (2008-06-01), Bodzin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nephelometer instrument for measuring turbidity of water does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nephelometer instrument for measuring turbidity of water, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nephelometer instrument for measuring turbidity of water will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4161382

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.