Negative ion atmospheric pressure ionization and selected...

Radiant energy – Ionic separation or analysis – With sample supply means

Reexamination Certificate

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C250S281000, C250S282000

Reexamination Certificate

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06956206

ABSTRACT:
Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a63Ni ion source and a drift tube for reaction of a sample with electrons from the63Ni ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from a63Ni ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.

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patent: 5869344 (1999-02-01), Linforth et al.
patent: 6596991 (2003-07-01), Yoshida et al.
patent: 6744041 (2004-06-01), Sheehan et al.

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