Near infrared chemical imaging microscope

Details Near infrared chemical imaging microscope Near infrared chemical imaging microscope

2006-03-28

2006-03-28

Porta, David (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

Reexamination Certificate

active

07019296

ABSTRACT:
A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.

REFERENCES:
patent: 3806257 (1974-04-01), Amos
patent: 4802760 (1989-02-01), Inoue et al.
patent: 5194912 (1993-03-01), Batchelder et al.
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5377004 (1994-12-01), Owen et al.
patent: 5381236 (1995-01-01), Morgan
patent: 5394499 (1995-02-01), Ono et al.
patent: 5442438 (1995-08-01), Batchelder et al.
patent: 5493443 (1996-02-01), Simon et al.
patent: 5528393 (1996-06-01), Sharp et al.
patent: 5623342 (1997-04-01), Baldwin et al.
patent: 5626134 (1997-05-01), Zuckerman
patent: 5645550 (1997-07-01), Hohla
patent: 5668664 (1997-09-01), Shishido
patent: 5689333 (1997-11-01), Batchelder et al.
patent: 5710626 (1998-01-01), O'Rourke et al.
patent: 5862273 (1999-01-01), Pelletier
patent: 5866430 (1999-02-01), Grow
patent: 5900975 (1999-05-01), Sussman
patent: 5901261 (1999-05-01), Wach
patent: 5910816 (1999-06-01), Fontenot et al.
patent: 5911017 (1999-06-01), Wach et al.
patent: 5943122 (1999-08-01), Holmes
patent: 5974211 (1999-10-01), Slater
patent: 6002476 (1999-12-01), Treado
patent: 6006001 (1999-12-01), Alfano et al.
patent: 6052187 (2000-04-01), Krishnan et al.
patent: 6069690 (2000-05-01), Xu et al.
patent: 6088100 (2000-07-01), Brenan et al.
patent: 6091872 (2000-07-01), Katoot
patent: 6175750 (2001-01-01), Cook et al.
patent: 6181414 (2001-01-01), Raz et al.
patent: 6222970 (2001-04-01), Wach et al.
patent: 6274871 (2001-08-01), Dukor et al.
patent: 6300618 (2001-10-01), Tanaami et al.
patent: 6392752 (2002-05-01), Johnson
patent: 6404497 (2002-06-01), Backman et al.
patent: 6483641 (2002-11-01), MacAulay
patent: 6485413 (2002-11-01), Boppart et al.
patent: 6530882 (2003-03-01), Farkas et al.
patent: 6571117 (2003-05-01), Marbach
patent: 6614532 (2003-09-01), Power et al.
patent: 6640130 (2003-10-01), Freeman et al.
patent: 6697665 (2004-02-01), Rava et al.
patent: 6734962 (2004-05-01), Treado et al.
patent: 2004/0004715 (2004-01-01), Tuschel et al.
patent: 0174778 (1988-11-01), None
patent: WO95/11624 (1995-05-01), None
patent: PCT/CA98/00092 (1998-08-01), None
Skinner et al. “Remote Raman Microimaging Using An AOTF and a Spartially Coherent Microfiber Optical Probe,” Applied Spectroscopy, vol. 50 No. 8, (1996) pp. 1007-1014.
I. Lewis and P. Griffiths, “Raman Spectrometry with Fiber-Optic Sampling,” Applied Spectroscopy, vol. 50, No. 10, (1996) pp. 12A-29A.
Treado et al., “Indium Antimonide (InSb) Focal Plane Array(FPA) Detection for Near-Infrared Imaging Microscopy,” Applied Spectroscopy 48. (1994) p. 607.
Shukla et al., “A Raman Scattering From Ultraheavily-Iron Implanted and Laser-Annealed Silicon,” Physical Review B. vol. 34, No. 12, Dec. 15, 1986, pp. 8950-8953.
Dewilton et al., “A Raman Study of the Dopan Distribution in Submicron Pn Junctions in B+ or BF2+ Ion Implanted Silicon,” SPIE vol. 623 Advanced Processing and Characterization of Semiconductors III (1986) pp. 26-34.
Kirilov et al., “Amorphous Phase Transformation During Rapid Thermal Annealing of Ion-Implanted Si,” Mat'l Res. Soc. Symp. Proc., vol. 52 (1986) pp. 131-138.
Mizoguchi et al., “Raman Image Study of Flash-Lamp Annealing of Ion-Implanted Silicon,” Journal of Applied Physics 77 (7) Apr. 1, 1995, pp. 3388-3392.
Othonos et al., “Raman Spectroscopy and Spreading Resistance Analysis of Phosphorous Implanted and Annealed Silicon,” Journal of Applied Physics, 75 (12) Jun. 1994, pp. 8032-8038.
Othonos et al., “Multi-Wavelength Raman Probing of Phosphorus Implanted Silicon Wafers,” Nucl. Instr. and Meth. in Phys. Rev. B., 117 (1996) pp. 367-374.
Christofides et al., “Reconstruction Mechanisms in Ion Implanted and Annealed Silicon Wafers,” Defect and Diffusion Forum, vols. 117-118 (1985) pp. 45-64.
Ishioka et al., “Reduction in Raman Intensity of Si (1 1 1) Due to Defect Formation During Ion Irradiation,” Solid State Communications, vol. 96, No. 6 (1995) pp. 387-390.
Dey et al., “Raman Scattering Characterization of Si(100) Implanted With Mega-Electron-Volt Sb”, Journal of Applied Physics 87(3) Feb. 1, 2000, pp. 1110-1116.
Jain et al., “Raman Scattering From Ion-Implanted Silicon,” Physical Review B., vol. 32, No. 10, Nov. 15, 1985, pp. 6688-6691.
Dewilton et al., “Raman Spectroscopy For NonDestructive Depth Profile Studies Of Ion Implantation in Silicon”, J. Electrochem. Soc.: Solid State Science And Technology, May 1986, pp. 988-993.
Zhang et al., “Details of Damage Profile in Self-Ion-Implanted Silicon,” vol. 25 Journal of Raman Spectroscopy, (1994) pp. 515-520.
Gorelick, “Raman and Non-Linear Light Scattering From Undersurface Layers Of Ion Implanted Silicon Crystals,” Materials Science Forum, vol. 173-174 (1995) pp. 237-242.
Morris, Hoyt, Miller and Treado, “Liquid Crystal Tunable Filter Raman Chemical Imaging,” Applied Spectroscopy, No. 50, No. 6, Jun. 1996 pp. 805-811.
Nakashima et al., “Raman Microprobe Study of Recrystallization in Ion-Implanted and Laser-Annealed Polycrystalline Silicon,” Journal of Applied Physics 54(5) May 1983 pp. 2611-2617.
Patrick J. Treado, “Chemical Imaging Reveals More Than The Microscope,” Laser Focus World, Oct., (1995) pp. 1-7.
Morris, “Ultrasensitive Raman and Flourescence Imaging Using Liquid Crystal Tunable Filters,” SPIE vol. 2385, (1995) pp. 81-87.
Robert D. Guenther, “Modern Optics, Polarization By BiRefringence,” (John Wiley & Son 1990) pp. 529-534.
Gerald C. Holst, “Electro-Optical Imaging System Performance,” SPIE Optical Engineering Press, pp. 218-219, 238-239, 248-257, 266-269.
Jeff Hecht, “Imaging and Illuminating Fiber Optics,” Chapter 28, (3rd ed. 1999) pp. 567-581.
Treado et al., “Infrared Raman Spectroscopic Imaging,” (Marcell Decker, 1992) pp. 71-108.
Treado et al., “A Thousand Points Of Light: The Hadamard Transform In Chemical Analysis And Instrumentation,” Analytical Chemistry, vol. 61, No. 11, Jun. 1, 1989, pp. 723-734.
Treado et al., “High-Fidelity Raman Imaging Spectrometry: A Rapid Method Using An Acousto-Optic Tunable Filter”, Applied Spectroscopy, vol. 46, No. 8, (1992) pp. 1211-1216.
Treado et al., “Near-Infrared Acousto-Optic Filtered Spectroscopic Microscopy: A Solid-State Approach To Chemical Imaging”, Applied Spectroscopy, vol. 46, No. 4 (1992) pp. 553-559.
Morris et al., “Imaging Spectrometers for Fluorescence and Raman Microscopy: Acousto-Optic and Liquid Crystal Tunable Filter,” Applied Spectroscopy, vol. 48, No. 7 (1994) pp. 857-866.
Turner et al., “LCTF Raman Chemical Imaging in the Near-Infrared,” SPIE vol. 3061 (1997) pp. 280-283.
“RAVEN Raman Imaging Fiberscope—A Tool for Insitu Material Analysis,” Ben Franklin Technology Center of Western Pennsylvania, date unknown.
Treado et al., “Engineering Study of the Feasibility of Incorporating a Raman Notch Filter into the Higher Temperature (HT) Fib

Affiliated with

Also associated with

Rating

Near infrared chemical imaging microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Near infrared chemical imaging microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Near infrared chemical imaging microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3600489