Near infrared chemical imaging microscope

Optics: measuring and testing – Plural test

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C356S051000, C356S318000, C356S417000, C250S339020, C250S339090, C250S339120

Reissue Patent

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RE039977

ABSTRACT:
A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflecteddelete-start id="DEL-S-00001" date="20080101" ?,delete-end id="DEL-S-00001" ?insert-start id="INS-S-00001" date="20080101" ?orinsert-end id="INS-S-00001" ?emitteddelete-start id="DEL-S-00002" date="20080101" ?or scattereddelete-end id="DEL-S-00002" ?near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selectingdelete-start id="DEL-S-00003" date="20080101" ?adelete-end id="DEL-S-00003" ?near infrared radiation imageinsert-start id="INS-S-00002" date="20080101" ?sinsert-end id="INS-S-00002" ?of the collimated beam.insert-start id="INS-S-00003" date="20080101" ?The spectrometer comprises a liquid crystal tunable filter.insert-end id="INS-S-00003" ?Thedelete-start id="DEL-S-00004" date="20080101" ?filtereddelete-end id="DEL-S-00004" ?insert-start id="INS-S-00004" date="20080101" ?selectedinsert-end id="INS-S-00004" ?images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.

REFERENCES:
patent: 3806257 (1974-04-01), Amos
patent: 4802760 (1989-02-01), Inoue et al.
patent: 5194912 (1993-03-01), Batchelder et al.
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5377004 (1994-12-01), Owen et al.
patent: 5381236 (1995-01-01), Morgan
patent: 5394499 (1995-02-01), Ono et al.
patent: 5442438 (1995-08-01), Batchelder et al.
patent: 5493443 (1996-02-01), Simon et al.
patent: 5528393 (1996-06-01), Sharp et al.
patent: 5623342 (1997-04-01), Baldwin et al.
patent: 5626134 (1997-05-01), Zuckerman
patent: 5645550 (1997-07-01), Hohla
patent: 5668664 (1997-09-01), Shishido
patent: 5689333 (1997-11-01), Batchelder et al.
patent: 5710626 (1998-01-01), O'Rourke et al.
patent: 5862273 (1999-01-01), Pelletier
patent: 5866430 (1999-02-01), Grow
patent: 5900975 (1999-05-01), Sussman
patent: 5901261 (1999-05-01), Wach
patent: 5910816 (1999-06-01), Fontenot et al.
patent: 5911017 (1999-06-01), Wach et al.
patent: 5943122 (1999-08-01), Holmes
patent: 5943129 (1999-08-01), Hoyt et al.
patent: 5974211 (1999-10-01), Slater
patent: 6002476 (1999-12-01), Treado
patent: 6006001 (1999-12-01), Alfano et al.
patent: 6052187 (2000-04-01), Krishnan et al.
patent: 6069690 (2000-05-01), Xu et al.
patent: 6088100 (2000-07-01), Brenan et al.
patent: 6091872 (2000-07-01), Katoot
patent: 6175750 (2001-01-01), Cook et al.
patent: 6181414 (2001-01-01), Raz et al.
patent: 6222970 (2001-04-01), Wach et al.
patent: 6274871 (2001-08-01), Dukor et al.
patent: 6300618 (2001-10-01), Tanaami et al.
patent: 6392752 (2002-05-01), Johnson
patent: 6403947 (2002-06-01), Hoyt et al.
patent: 6404497 (2002-06-01), Backman et al.
patent: 6483641 (2002-11-01), MacAulay
patent: 6485413 (2002-11-01), Boppart et al.
patent: 6530882 (2003-03-01), Farkas et al.
patent: 6571117 (2003-05-01), Marbach
patent: 6614532 (2003-09-01), Power et al.
patent: 6640130 (2003-10-01), Freeman et al.
patent: 6697665 (2004-02-01), Rava et al.
patent: 6711283 (2004-03-01), Soenksen
patent: 2004/0004715 (2004-01-01), Tuschel et al.
patent: 0174778 (1988-11-01), None
patent: WO95/11624 (1995-05-01), None
patent: PCT/CA98/00092 (1998-08-01), None
“RAVEN Raman Imaging Fiberscope—A Tool for Insitu Material Analysis,” Ben Franklin Technology Center of Western Pennsylvania, date unknown.
Treado et al., “Engineering Study of the Feasibility of Incorporating a Raman Notch Filter into the Higher Temperature (HT) Fiberscope,” Jul. 29, 1997.
Treado et al, “Incorporation of a Band Pass Filter into a High Temperature Raman Illumination Fiberscope,” Feb. 15, 1999.
Treado et al., “Incorporation of a Notch Filter into A High Temperature Raman Collection Fiberscope,” Jul. 20, 1998.
Gonzalez et al., “Digital Image Processing,” Addison-Wesley Publishing Co. (1992) pp. 21-79.
Patrick J. Treado, “A Miniaturized Raman Fiberscope for Remote Chemical Imaging,” Proposal Submitted to the Ben Franklin Technology Center of Western Pennsylvania, Mar. 21, 1, no date available.
Patrick J. Treado, “A Raman Endoscope for Breast Cancer Diagnosis,” Proposal submitted to the Ben Franklin Technology Center of Western Pennsylvania, Apr. 8, 1998.
Treado et al., “Indium Antimonide (InSb) Focal Plane Array(FPA) Detection for Near-Infrared Imaging Microscopy,” Applied Spectroscopy vol. 48, No. 5. (1994) p. 607.
Othonos et al., “Multi-Wavelength Raman Probing of Phosphorus Implanted Silicon Wafers,” Nuclear Instruments and Methods in Physics Research B., 117 (1996) pp. 367-374.
Ishioka et al., “Reduction in Raman Intensity of Si (1 1 1) Due to Defect Formation During Ion Irradiation,” Solid State Communications, vol. 96, No. 6 (1995) pp. 387-390.
Peter Miller, National Science Foundation Small Business Innovation Research Program, “High Definition Raman Imaging Microscope,” Jun. 1994.
Peter J. Miller, Small Business Innovation Research (SBIR) Phase I, “SBIR Phase I: High Definition Raman Imaging Microscope,” Sep. 13, 1996.
Peter J. Miller, National Science Foundation SBIR Phase II Proposal, “High-Definition Raman Imaging Microscope,” Oct. 1996.
Patrick J. Treado, Letter to Peter V. Foukal, Ph.D., Oct. 24, 1996.
Patrick J. Treado, Letter to Peter Miller, Oct. 28, 1996.
Miller, Peter J. and Hoyt, Clifford C., “Multispectral Imaging with a Liquid Crystal Tunable Filter,” SPIE vol. 2345, (1995) pp. 354-365.
Schaeberle, et al., “Raman Chemical Imaging: Histopathology of Inclusions in Human Breast Tissue,” Analytical Chemistry, vol. 68, No. 11, (1996), pp. 1829-1833.
Lewis et al., “A Miniaturzed, No-Moving-Parts Raman Spectrometer,” Applied Spectroscopy, vol. 47, No. 5, (1993) pp. 539-543.
Gift et al., “Near-Infrared Raman Imaging Microscope Based on Fiber-Bundle Image Compression,” Journal of Raman Spectroscopy, vol. 30 (1999), pp. 757-765.
Turner et al., “Near-Infrared Acousto-Optic Tunable Filter Hadamard Transform Spectroscopy,” Applied Spectroscopy, vol. 50, No. 2, (1996) pp. 227-284.
Schaeberle et al., “Multiplexed Acousto-Optic Tunable Filter (AOTF) Spectral Imaging Microscopy,” SPIE, vol. 2173, (1994) pp. 11-20.
Christensen et al., “Raman Imaging Using a Tunable Dual-Stage Liquid Crystal Fabry-Perot Interferometer,” Applied Spectroscopy, vol. 49, No. 8 (1995) pp. 1120-1125.
H.R. Morris and P.J. Treado, “LCTF Ramon Chemical Imaging of Thermoplastic Otefin (TPO) Architecture,” Proc. Xvth ICORS, S.A. Asher, Ed (Willey, Chichester, 1996) 1186-1187.
M.D. Schaeberle and P.J. Treado, “LCTF Raman Chemical Imaging of Semiconductors,” Proc. Xvth ICORS, S.A. Asher, Ed (Wiley, Chichester, 1996) 1188-1189.
H. Skinner, T. Cooney , S. Sharma and S. Angel. “Remote Raman Microimaging Using an AOTF and a Spatially Coherent Microfiber Optical Probe”. vol. 50Applied SpectroscopyNo. 8, pp. 1007-1014 (1996).
I. Lewis and P. Griffiths, “Raman Spectrometry with Fiber-Optic Sampling”, vol. 50Applied Spectroscopy, No. 10, pp. 12A-29A (1996).
Patrick J. Treado, Ira W. Levin, and E. Neil Lewis, Indium Antimonide (InSb) Focal Plane Array (FPA) Detection for Near-Infrared Imaging Microscopy. Applied Spectroscopu 48. (1994) 607.
Treado et al. “A Thousand Ponts of Light: The Hadamard Transform”Analytical Chemistry61 (1989) Ju

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