Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-03-29
2005-03-29
Potter, Roy (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S787000, C438S106000
Reexamination Certificate
active
06873049
ABSTRACT:
Near-hermetic performance has been reported for power semiconductor devices having a silicon carbide layer deposited on the surface at the semiconductor wafer level. The P-COB device also includes a conformal coating on the silicon carbide layer, which extends the expected lifetime of the P-COB device longer than those devices active coatings.
REFERENCES:
patent: 5685071 (1997-11-01), Gates, Jr. et al.
www.manufacturingcenter.com/dfx/archives, “Microsealing: Passivation Processing Provides Wafer-Level Hermetic Protection”. Designfax, Jun. 2001, pp. 1 and 2, Nelson Publishing, Inc.
Potter Roy
Sonnenschein Nath & Rosenthal LLP
The Boeing Company
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