Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2011-07-05
2011-07-05
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
07973937
ABSTRACT:
A method for reducing noise in a multi-aperture imaging system is provided. Each sub-collector of the system, at least one of which has an adjustable optical path length, collects a portion of a wavefront. The adjustable optical path length is varied to each of a set of predetermined lengths to generate interference patterns. Each interference pattern is recorded at an image plane of the system to generate a recorded interference pattern made up of pixels. Pixel intensity data sets are generated, each of which includes a pixel intensity level from a corresponding one of the pixels from each recorded interference pattern. Each pixel intensity data set is Fourier transformed, and in each Fourier transformed data set, spatial frequencies having power values above a predetermined level are identified. The power levels exceeding the threshold are measured and a resultant image is constructed, where each image pixel thereof corresponds to one pixel intensity data set and has one or more intensity values corresponding to the measured power values for that corresponding pixel intensity data set.
REFERENCES:
patent: 4136954 (1979-01-01), Jamieson
patent: 6714304 (2004-03-01), Ota
patent: 6882427 (2005-04-01), Kendrick et al.
patent: 7105755 (2006-09-01), Imamura
patent: 2004/0095580 (2004-05-01), Kendrick et al.
Kendrick Richard L.
Smith Eric H.
Chowdhury Tarifur
Hansen Jonathan M
Lockheed Martin Corporation
McDermott Will & Emery LLP
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