Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1989-08-16
1990-04-17
Bovernick, Rodney B.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
250216, 35016211, 350507, G02B 518, G02B 2100, H01J 314, H01J 516
Patent
active
049174622
ABSTRACT:
An aperture probe in the form of a tapered metal-coated glass pipette having a thin tip provides near-field access to a sample for near-field microscopy. The pipette is formed from a glass tube drawn down to a fine tip, and then coated, as by evaporation, by a metallic layer. The central opening of the tube is drawn down to a submicron diameter, and the metal coating is formed with an aperture at that opening. Aperture diameters down to 500 Angstroms diameter are provided. Also disclosed is a microscope utilizing the pipette aperture for scanning near-field imaging of samples.
REFERENCES:
patent: 3155505 (1964-11-01), Shannon
patent: 3607680 (1971-09-01), Uno et al.
patent: 3668028 (1972-06-01), Short
patent: 3782823 (1974-01-01), Kantorski et al.
patent: 3852134 (1974-12-01), Bean
patent: 4030827 (1977-06-01), Delhaye et al.
patent: 4100416 (1978-07-01), Hirschfeld
patent: 4155801 (1979-05-01), Provancher
patent: 4182010 (1980-01-01), Lemmond
patent: 4195930 (1980-04-01), Delhaye et al.
patent: 4262186 (1981-04-01), Provancher
patent: 4269653 (1981-05-01), Wada et al.
patent: 4331505 (1982-05-01), Hirt
patent: 4511222 (1985-04-01), Biren
patent: 4604520 (1986-08-01), Pohl
Review of Scientific Instruments, 49 (12), pp. 1735-1740, Dec. 1978, "Piezo driven 50 .mu.m Range Stage with Subnanometer Resolution", by Frederick E. Scire et al.
Ash, A. et al., "Super-Resolution Aperture Scanning Microscop", Nature, vol. 237, pp. 510-512, Jun. 30, 1972.
Harootunian, A et al., "ThN6. Near-Field Investigation of Submicrometer Apertures at Optical Wavelengths", Optical Society of America, Nov. 1984.
Lewis, A et al., "Near-Field Scanning Optical Microscopy", Physics Today, pp. S12-S13, Jan. 1985.
Lewis, A et al., "Scanning Optical Spectral Microscopy with 500.ANG. Spatial Resolution", Biophysical Journal, vol. 41, p. 405a, Feb. 1983.
Lewis, A et al., "Development of a 500 .ANG. Spatial Resolution Light Microscope", Ultramicroscopy, vol. 13, No. 3, pp. 227-232, 1984.
Moharir, P. S., "Two-Dimensional Encoding Masks for Hadamard Spectrometric Imager", IEEE Transactions on Electromagnetic Compatibility, vol. EMC-16, No. 2, pp. 126-129, May 1974.
Pohl, D. W. et al., "Optical Stethoscopy: Image Recording with Resolution /20", Appl. Phys. Lett., pp. 651-653, Apr. 1, 1984, vol. 44, No. 7.
Weisburd, S., "Light Returns with Resolve", Science News, vol. 125, pp. 262, 1984.
Betzig R. Eric
Harootunian Alec
Isaacson Michael
Lewis Aaron
Bovernick Rodney B.
Cornell Research Foundation Inc.
Kachmarik Ronald M.
LandOfFree
Near field scanning optical microscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Near field scanning optical microscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Near field scanning optical microscopy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1047920