Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning near-field optical microscopy or apparatus...
Reexamination Certificate
2007-08-31
2009-11-24
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Scanning near-field optical microscopy or apparatus...
C850S030000, C850S031000, C977S862000, C977S860000, C977S849000
Reexamination Certificate
active
07621964
ABSTRACT:
An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.
REFERENCES:
patent: 2006/0097163 (2006-05-01), Hoen et al.
Hoshino Kazunori
Zhang Xiaojing
Berman Jack I
Chang Hanway
Dillon & Yudell LLP
Ng Anthony P.
The Board of Regents University of Texas System
LandOfFree
Near-field scanning optical microscope probe having a light... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Near-field scanning optical microscope probe having a light..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Near-field scanning optical microscope probe having a light... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4056937