Near-field scanning optical microscope probe having a light...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning near-field optical microscopy or apparatus...

Reexamination Certificate

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Details

C850S030000, C850S031000, C977S862000, C977S860000, C977S849000

Reexamination Certificate

active

07621964

ABSTRACT:
An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.

REFERENCES:
patent: 2006/0097163 (2006-05-01), Hoen et al.

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