Near field scanning microscope probe and method for...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C977S862000

Reexamination Certificate

active

07372013

ABSTRACT:
A near-field scanning microscopy probe and a method for doing the same. A metal plasmon or dielectric waveguide is connected to a deformable material and coupled to a dielectric waveguide on a chip. The probe pops up out of the plane of the chip. The probe can be easily integrated with standard on-chip optical components.

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