Near-field probe for use in scanning system

Details Near-field probe for use in scanning system Near-field probe for use in scanning system

2005-03-29

2005-03-29

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120

Reexamination Certificate

active

06873165

ABSTRACT:
A near electric-field probe is driven by a short laser pulse delayed through an optical delay-line for detecting vectors of near-field components of electrical signals propagating through a device under test including an electrical device or an electronic circuit based on a sampling principle. The near-field probe includes a photoconductive switch assembly including a thin semiconductor photoconductive body, at least two separated switch electrodes formed on the thin semiconductor photoconductive body, and an electrode gap formed between the two separated switch electrodes; and an optical waveguide attached to one side of the photoconductive switch assembly by using an optical adhesive, wherein the optical waveguide is partially coated with conductive material on the outer surface thereof.

REFERENCES:
patent: 5416327 (1995-05-01), Weiss et al.
patent: 5936237 (1999-08-01), van der Weide

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