Optics: measuring and testing – Lamp beam direction or pattern
Patent
1991-09-06
1993-10-12
Rosenberger, Richard A.
Optics: measuring and testing
Lamp beam direction or pattern
356222, G01J 100
Patent
active
052530361
ABSTRACT:
A near-field goniophotometric apparatus and method for measuring the three-dimensional near-field distribution of luminous flux surrounding a light source. The apparatus incorporates an imaging photometer mounted on a rotatable arm. The photometer is designed to measure the helios of a volume of space rather than the luminance of a planar surface, and to simultaneously measure the helios of a plurality of such volumes. A control mechanism is provided to position the arm and to rotate the light source relative to the arm. The method facilitates prediction of the illuminance or irradiance at a point on a plane from the helios measurements.
REFERENCES:
patent: 3358944 (1967-12-01), Ule
patent: 4110049 (1978-08-01), Younskevicius
patent: 4491727 (1985-01-01), Appelbaum et al.
American National Standard Nomenclature and Definitions for Illuminating Engineering (ANSI/IES RP-6-1986), IESNA, N.Y., NY.
Ashdown, I.E. [1990]. "A Scanning Goniophotometer for Near Field Photometry", Unpublished paper presented Jun. 19, 1990, International Lighting Exposition, Toronto, Ont., Canada.
Bradford, R. A. and S. Stannard [1991]. "Refinements to Application Distance Photometry", 1991 IESNA Annual Conference Technical Papers, Illuminating Engineering Society of North America, N.Y., NY.
Cohen, M. F. and D. P. Greenberg [Jul. 1985]. "The Hemi-Cube: A Radiosity Solution for Complex Environments", ACM Transactions on Graphics 19:3 (SIGGRAPH '85 Proceedings), 31-40.
Dunlop, D. and D. M. Finch [Mar. 1962]. "Photometry of Fluorescent Luminaires-Rotating Photocell Method", Illuminating Engineering 57:3, 159-165.
Franck, K. [Dec. 1950]. "A Method of Testing and Evaluating Fluorescent Luminaires", Illuminating Engineering 45:12, 763-770.
Horn, C. E., W. F. Little and E. H. Salter [Feb. 1952]. "Relation of Distance to Candlepower Distribution from Fluorescent Luminaires", Illuminating Engineering 47:2, 99-104.
Johnson, R. C., H. A. Ecker and J. S. Hollis [Dec. 1973]. "Determination of Far-Field Antenna Patterns from Near-Field Measurements", Proc. IEEE 61:12, 1668-1694.
Lautzenheiser, T., G. Weller and S. Stannard [1984]. "Photometry for Near Field Applications", J. IES 13:1, 262-269, Jan. 1984.
Levin, R. E. [Oct. 1968]. "Luminance-A Tutorial Paper", J. SMPTE 77:10, 1005-1011.
Levin, R. E. [Apr. 1971]. "Photometric Characteristics of Light Controlling Apparatus", Illuminating Engineering 66:4, 205-215.
Levin, R. E. [1982]. "The Photometric Connection-Part 1", Lighting Design & Application (Sep.), 28-35; . . . Part 2, Lighting Design & Application (Oct.), 60-63; . . . Part 3, Lighting Design & Application (Nov.), 42-47; and, . . . Part 4, Lighting Design and Application (Dec.), 16-18.
Lewin, I. [1991]. "Photometry: How Near, How Far?", Lighting Magazine (Feb.), 33-34; and, . . . Part 2, Lighting Magazine (Jun.), 45-46.
Losh, J. A. [May 1954]. "A Rectangular Coordinate Photometer for Large-Area Luminaires", Illuminating Engineering 49:5, 258-264.
Mistrick, R. G. and C. R. English [1990]. "A Study of Near-Field Indirect Lighting Calculations", J. IES 19:2 (Summer), 103-112.
Moon, P. and D. E. Spencer [Sep. 1944]. "Brightness and Helios", Illuminating Engineering 39:9, 507-520.
Moon, P. and D. E. Spencer [1981]. "The Photic Field", MIT Press, Cambridge, Mass.
Ngai, P. Y. [1987]. "On Near-Field Photometry", J. IES 16:2 (Summer), 129-136.
Ngai, P. Y., F. G. Zhang and J. X. Zhang [Jan. 1991]."Near-Field Photometry: Measurement and Application for Fluorescent Luminaires", Jan.-1991 IESNA Annual Conference Technical Papers, Illuminating Engineering Society of North America, N.Y., NY.
Rea, M. S. and I. G. Jeffrey [1990], "A New Luminance and Image Analysis System for Lighting and Vision", J. IES 19:1 (Winter), 64-72.
Schaefer, A. R. and K. Mohan [1974]. "A New Gonioradiometer for Total Flux Measurements", J. IES 3:7, 349-353; Jul. 1974.
Skinner, G. K. [1988]. "X-Ray Imaging with Coded Masks", Scientific American (Aug.), 84-89; Aug.-1988.
D. E. Spencer and R. E. Levin [Apr. 1966]. "On the Significance of Photometric Measurements", Illuminating Engineering 61:4, 196-204.
Stannard, S. and J. Brass [1990]. "Application Distance Photometry", J. IES 19:1 (Winter), 39-46.
Takahashi, S., S. Okadu and K. Fujii [Apr. 1982]. "Development of Luminance Pattern Analyzer Utilizing Industrial TV Techniques", J. IES 11:4, 147-152.
Yamauti, Z. [Oct. 1932] "Theory of Field of Illumination", Researches of the Electrotechnical Laboratory (Oct.), Electrotechnical Laboratory, Ministry of Communications, Tokyo, Japan.
Gershun, A. [1936] "Svetovoe Pole" (The Light Field), Moscow, Translated by P. Moon and G. Timoshenko in Journal of Mathematics and Physics vol. XVIII (1939), Massachusetts Institute of Technology.
Ledalite Architectural Products Inc.
Pham Hoa Q.
Rosenberger Richard A.
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