Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-10-22
1999-05-18
Kim, Robert
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B9/02
Patent
active
059055731
ABSTRACT:
A resonant planar optical waveguide probe for measuring critical dimensions on an object in the range of 100 nm and below. The optical waveguide includes a central resonant cavity flanked by Bragg reflector layers with input and output means at either end. Light is supplied by a narrow bandwidth laser source. Light resonating in the cavity creates an evanescent electrical field. The object with the structures to be measured is translated past the resonant cavity. The refractive index contrasts presented by the structures perturb the field and cause variations in the intensity of the light in the cavity. The topography of the structures is determined from these variations.
Kaushik Sumanth
Stallard Brian R.
Cone Gregory A.
Kim Robert
Sandia Corporation
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