Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning near-field optical microscopy or apparatus...
Reexamination Certificate
2005-11-19
2009-11-17
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Scanning near-field optical microscopy or apparatus...
C850S001000, C850S008000, C850S010000, C850S049000, C850S058000, C850S059000, C850S030000, C850S057000, C250S306000, C250S307000, C250S310000, C250S234000, C250S201300, C250S216000, C250S227260, C250S235000, C428S364000, C428S328000, C428S131000, C428S156000, C073S105000, C324S754090, C385S038000, C385S117000, C385S118000
Reexamination Certificate
active
07618465
ABSTRACT:
The invention relates to a near-field antenna comprising a dielectric shaped body having a tip. The shaped body is characterized in that at least the surface of the tip is metallized, thereby enhancing the sensitivity of devices comprising the near-field antenna, for example, spectroscopes, microscopes or read-write heads.
REFERENCES:
patent: 4994818 (1991-02-01), Keilmann
patent: 5936237 (1999-08-01), van der Weide
“Near-Field Antennas Integrated With Scanning Probes for THZ to visible Microscopy: Scale Modeling and Limitations on Performance” Rosner, B., Peck, J., van der Weide D., IEEE Transactions of Antennas and Propagation, vol. 50, No. 5, pp. 670 to 675, May 2002.
“Long-Wave-Infrared Near-Field Microscopy” Keilman, F., Knoll, B., Kramer, A., Phys. Stat. Sol. (b) vol. 215, pp. 849 to 854 (1999).
“Near-field mirowave microscope with improved sensitivity and spaial resolution”, Tselev, A., Anlage, S.M., Christen, H.M., Moreland,R.L., Talanov, V.V., Schwartz, A.R., Review of Scientific Instruments vol. 74, No. 6, pp. 3167 to 3170, Jun. 2003.
“Development of terahertz wave microscopes” Yuan,T., Xu,J.Z., Zhang, X.-C., Infrared Physics and Technology, vol. 45, pp. 417 to 425, 2004.
Kadlec Filip
Klein Norbert
Kuźel Petr
Berman Jack I
Forschungszentrum Julich GmbH
Sahu Meenakshi S
Wilford Andrew
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