Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
Reexamination Certificate
2007-06-12
2007-06-12
Chau, Minh (Department: 2854)
Electricity: measuring and testing
Using ionization effects
For analysis of gas, vapor, or particles of matter
C324S465000, C427S058000
Reexamination Certificate
active
11151902
ABSTRACT:
A sensor having a nanotube grown on and supported by thermal bimorph structures. The nanotube rests on a heat sink during sensing gas or a liquid and is moved from the heat sink when the nanotube is heated to desorb gas or liquid from it. The heatsink may function as a gate along with the bimorph structures as the other terminals of a transistor. Current-voltage and current-gate voltage characteristics may be obtained of the nanotube as a device like a transistor. These characteristics may provide information on a gas or liquid absorbed by the nanotube.
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Cole Barrett E.
Higashi Robert E.
Chau Minh
Fredrick Kris T.
Honeywell International , Inc.
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