Nanotip repair and characterization using field ion microscopy

Details Nanotip repair and characterization using field ion microscopy Nanotip repair and characterization using field ion microscopy

2011-04-05

2011-04-05

Kim, Robert (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Calibration aspect, e.g., calibration of probes

C850S040000, C850S052000, C850S056000, C850S057000

Reexamination Certificate

active

07921465

ABSTRACT:
A system (100) for characterizing surfaces can include a nanotip microscope (104) in a first pressure envelope (102) at a first pressure with an electrically conductive nanotip (110) mounted thereon for characterizing a sample surface. The system can also include an ion imaging system (122, 124, 128) within a second pressure envelope (120) at a second pressure. The second pressure can less than or equal to the first pressure and the pressure envelopes (102, 120) can be separated by a pressure limiting aperture (PLA) (132). The system can further include gas sources (116, 118) for introducing into the first pressure envelope (102) at least one gas, and a voltage supply (114) coupled to the nanotip (110) for generating an electric field between the nanotip (114) and the PLA (132). In the system, the electric field repels and ionizes molecules or atoms of the gas in proximity to the nanotip (110) and the ion imaging system (122, 124, 128) collects at least a portion the repelled and ionized molecules or atoms traversing the PLA (132) to image the nanotip (110).

REFERENCES:
patent: 5151594 (1992-09-01), McClelland
patent: 2007/0025907 (2007-02-01), Rezeq et al.

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