Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-06
2011-12-06
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
08072226
ABSTRACT:
Embodiments feature a sensor including a nanostructure and methods for manufacturing the same. In some embodiments, a sensor includes a substrate, a first electrode disposed on the substrate, and a second electrode disposed on the substrate. The second electrode is spaced apart from the first electrode and surrounding the first electrode. The sensor includes at least one nanostructure contacting the first electrode and the second electrode, in which the nanostructure is configured to vary an electrical characteristic according to an object to be sensed.
REFERENCES:
patent: 6918284 (2005-07-01), Snow et al.
patent: 7052588 (2006-05-01), Gu et al.
patent: 7065857 (2006-06-01), Watanabe et al.
patent: 7129554 (2006-10-01), Lieber et al.
patent: 7135728 (2006-11-01), Duan et al.
patent: 7233041 (2007-06-01), Duan et al.
patent: 7256466 (2007-08-01), Lieber et al.
patent: 7385267 (2008-06-01), Lieber et al.
patent: 7619290 (2009-11-01), Lieber et al.
patent: 7701014 (2010-04-01), Mostarshed et al.
patent: 2004/0104129 (2004-06-01), Gu et al.
patent: 2004/0192072 (2004-09-01), Snow et al.
patent: 2006/0169585 (2006-08-01), Nagahara et al.
patent: 2010/0050745 (2010-03-01), Liu et al.
patent: 2010/0155696 (2010-06-01), Duan et al.
patent: WO2005074467 (2005-08-01), None
patent: WO2006076044 (2006-07-01), None
Wolfgang Hoenlein et al.; “Nanoelectronics beyond silicon”; Microelectronic Engineering 83; pp. 619-623; 2006.
Michael W. Miller et al.; “Large-scale assembly of carbon nanotubes”; Nature Publishing Group; pp. 36-37; 2003.
International Search Report and Written Opinion of the ISA/KR for PCT/KR2007/003767; dated Nov. 14, 2007 (9 pages).
Extended European Search Report issued in 07807968.8 on Jan. 31, 2011, 7 pages.
Jing Li et al., “Carbon Nanotube Sensors for Gas and Organic Vapor Detection,” Nano Letters, American Chemical Society, Washington, DC, vol. 3, No. 7, Jun. 13, 2003, pp. 929-933.
Cheon Jun Ho
Park Young June
Seo Sung Min
Benitez Joshua
Fish & Richardson P.C.
Phan Huy Q
SNU & R&DB Foundation
LandOfFree
Nanostructure sensors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nanostructure sensors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nanostructure sensors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4294887