Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2011-07-12
2011-07-12
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
C356S445000, C382S154000
Reexamination Certificate
active
07978343
ABSTRACT:
An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.
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Carney Paul Scott
Hillenbrand Rainer
Schotland John C.
Sun Jin
Pham Hoa Q
Sunstein Kann Murphy & Timbers LLP
The Board of Trustees of the University of Illinois
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