Nanoparticle cap layer

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material

Reexamination Certificate

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C257SE21174, C257SE21582

Reexamination Certificate

active

08039379

ABSTRACT:
Functionalized nanoparticles are deposited on metal lines inlaid in dielectric to form a metal cap layer that reduces electromigration in the metal line. The functionalized nanoparticles are deposited onto activated metal surfaces, then sintered and annealed to remove the functional agents leaving behind a continuous capping layer. The resulting cap layer is about 1 to 10 nm thick with 30-100% atomic of the nanoparticle material. Various semiconductor processing tools may be adapted for this deposition process without adding footprint in the semiconductor fabrication plant.

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