Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe manufacture
Reexamination Certificate
2011-05-17
2011-05-17
Vanore, David A (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
Probe manufacture
C850S052000, C850S056000, C850S057000, C850S059000, C977S840000, C977S849000, C977S860000, C977S947000
Reexamination Certificate
active
07945966
ABSTRACT:
The invention relates to a nanoprobe comprising a silica fiber (2) with an end opening having a diameter of less than 100 nm, and a metallic sheath (11). The total diameter of the silica part and the metallic sheath (11) is less than 300 nm. The invention also relates to a method for producing one such nanoprobe.
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patent: 1 408 327 (2004-04-01), None
EPO International Search Report re PCT/FR2006/001279, completed Sep. 21, 2006, mailed Sep. 28, 2006.
R. Stockle, et al., “High-Quality Near-Field Optical Probes by Tube Etching,” Applied Physics Letters, American Institute of Physics, Jul. 12, 1999, vol. 75, No. 2, pp. 160-162.
N. Kumar, et al., “Summary Abstract: Aluminum Deposition on Optical Fibers by a Hollow Cathode Magnetron Sputtering System,” Journal of Vacuum Science & Technology, May 1988, vol. 6, No. 3, pp. 1772-1774.
R.C. Dunn, “Near-Field Scanning Optical Microsopy,” Chemical Reviews, 1999, vol. 99, No. 10, pp. 2891-2927.
Chaigneau Marc
Louarn Guy
Minea Tiberiu
Ollivier Guirec
Duane Morris LLP
Ippolito Rausch Nicole
Vanore David A
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