Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe manufacture
Reexamination Certificate
2009-04-14
2011-10-25
Maskell, Michael (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
Probe manufacture
C850S033000, C850S040000, C850S042000, C850S060000, C250S306000, C250S307000, C073S105000, C977S860000, C977S875000, C977S877000
Reexamination Certificate
active
08046843
ABSTRACT:
An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample material with respect to each other, and a controller. The controller controls the probe positioning apparatus in positioning the probe over the sample and controls the tip positioning apparatus in lowering the tip into the sample material to produce an interaction between the porous tip and the sample material.
REFERENCES:
patent: 5266801 (1993-11-01), Elings et al.
patent: 5548117 (1996-08-01), Nakagawa
patent: 6252226 (2001-06-01), Kley
General Nanotechnology LLC
Kilpatrick Townsend & Stockton LLP
Maskell Michael
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